Lugege ainult LitRes'is

Raamatut ei saa failina alla laadida, kuid seda saab lugeda meie rakenduses või veebis.

Основной контент книги Machine Vision Inspection Systems, Machine Learning-Based Approaches
Teksttekst

Maht 533 leheküljed

0+

Machine Vision Inspection Systems, Machine Learning-Based Approaches

Lugege ainult LitRes'is

Raamatut ei saa failina alla laadida, kuid seda saab lugeda meie rakenduses või veebis.

€230,76

Raamatust

Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes image processing, machine vision and, pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation industry. Now a day's the current research on machine inspection gained more popularity among various researchers, because the manual assessment of the inspection may fail and turn into false assessment due to a large number of examining while inspection process.

This volume 2 covers machine learning-based approaches in MVIS applications and it can be employed to a wide diversity of problems particularly in Non-Destructive testing (NDT), presence/absence detection, defect/fault detection (weld, textile, tiles, wood, etc.), automated vision test & measurement, pattern matching, optical character recognition & verification (OCR/OCV), natural language processing, medical diagnosis, etc. This edited book is designed to address various aspects of recent methodologies, concepts, and research plan out to the readers for giving more depth insights for perusing research on machine vision using machine learning-based approaches.

Žanrid ja sildid

Logi sisse, et hinnata raamatut ja jätta arvustus
Raamat «Machine Vision Inspection Systems, Machine Learning-Based Approaches» — loe veebis. Jäta kommentaare ja arvustusi, hääleta lemmikute poolt.
Vanusepiirang:
0+
Objętość:
533 lk 322 illustratsiooni
ISBN:
9781119786108
Kustija:
Õiguste omanik:
John Wiley & Sons Limited