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Mechanical Stress on the Nanoscale. Simulation, Material Systems and Characterization Techniques
191,29 €
Raamatust
Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.
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Vanusepiirang:
0+Ilmumiskuupäev Litres'is:
03 oktoober 2018Objętość:
382 lk ISBN:
9783527639564Üldsuurus:
8.8 МБLehekülgede koguarv:
382Õiguste omanik:
John Wiley & Sons Limited
