Silicon Carbide, Volume 1

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Growth, Defects, and Novel Applications
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This book prestigiously covers our current understanding of SiC as a semiconductor material in electronics. Its physical properties make it more promising for high-powered devices than silicon.<br> The volume is devoted to the material and covers methods of epitaxial and bulk growth. Identification and characterization of defects is discussed in detail. The contributions help the reader to develop a deeper understanding of defects by combining theoretical and experimental approaches. <br> Apart from applications in power electronics, sensors, and NEMS, SiC has recently gained new interest as a substrate material for the manufacture of controlled graphene. SiC and graphene research is oriented towards end markets and has high impact on areas of rapidly growing interest like electric vehicles. <br> The list of contributors reads like a «Who's Who» of the SiC community, strongly benefiting from collaborations between research institutions and enterprises active in SiC crystal growth and device development. <br>

Täpsemad andmed
Vanusepiirang:
0+
Lisatud LitResi:
28 september 2018
Maht:
530 lk.
ISBN:
9783527629060
Kogusuurus:
23 MB
Lehekülgi kokku:
530
Lehekülje mõõdud:
170 x 240 мм
Toimetajad:
Gerhard Pensl, Lothar Ley, Peter Friedrichs, Tsunenobu Kimoto
Kirjastaja:
Wiley
Copyright:
John Wiley & Sons Limited
"Silicon Carbide, Volume 1" — loe veebis tasuta üht katkendit raamatust. Kirjutage kommentaare ja ülevaateid, hääletage oma lemmiku poolt.

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